On-line IDDQ fault testing for CMOS/BiCMOS logic families.
Kaamran RaahemifarMajid AhmadiPublished in: ISCAS (1) (1999)
Keyphrases
- delay insensitive
- fault model
- fault diagnosis
- high speed
- modal logic
- low cost
- chip design
- power consumption
- low power
- random access memory
- computational properties
- logical framework
- classical logic
- software testing
- mixed signal
- multi valued
- fault detection
- proof theory
- real time
- analog vlsi
- floating gate
- asynchronous circuits
- single chip
- correlation analysis
- fuzzy logic
- neural network