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Board level reliability of PBGA using flex substrate.

S. C. HungP. J. ZhengS. H. HoS. C. LeeH. N. ChenJ. D. Wu
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • image processing
  • probabilistic model
  • highly reliable
  • confidence levels
  • data sets
  • real world
  • higher level
  • reliability analysis