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Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits.
Karim Arabi
Bozena Kaminska
Published in:
ITC (1997)
Keyphrases
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integrated circuit
mixed signal
built in self test
low power
multi channel
vlsi circuits
digital circuits
power consumption
low cost
high speed
electron beam
cmos technology
single chip
signal processing
printed circuit boards