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Practices in Mixed-Signal and RF IC Testing.

Salem AbdennadherSaghir A. Shaikh
Published in: IEEE Des. Test Comput. (2007)
Keyphrases
  • mixed signal
  • vlsi circuits
  • multi channel
  • low power
  • test cases
  • radio frequency
  • case study
  • relevance feedback
  • pattern recognition
  • digital images
  • low cost
  • edge detection
  • integrated circuit
  • digital circuits
  • low voltage