Mainstream ATE: To Reduce LSI and VLSI Test Cost.

Michael W. Salter Kemon P. Taschioglou

Published in: ITC (1989)

Keyphrases

signal processing
test data
vlsi design
maintenance cost
latent semantic indexing
neural network
bandwidth consumption
testing process
high cost
real time
minimum cost
significantly reduced
statistical tests
cost sensitive
text retrieval
case study
information retrieval