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On path selection for delay fault testing considering operating conditions [logic IC testing].

Bharath SeshadriIrith PomeranzSudhakar M. ReddySandip Kundu
Published in: ETW (2003)
Keyphrases
  • operating conditions
  • fault diagnosis
  • steady state
  • path selection
  • test set
  • test cases
  • decision trees
  • data streams