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Automated Test Generation for Debugging Multiple Bugs in Arithmetic Circuits.

Farimah FarahmandiPrabhat Mishra
Published in: IEEE Trans. Computers (2019)
Keyphrases
  • test generation
  • test cases
  • software testing
  • high speed
  • static analysis
  • test sequences
  • symbolic execution
  • data sets
  • computer vision
  • software systems