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Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits through High-Level Mutant Injection.
Valerio Guarnieri
Franco Fummi
Krishnendu Chakrabarty
Published in:
Asian Test Symposium (2012)
Keyphrases
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reduced complexity
test generation
high level
vector quantization
test cases
fault diagnosis
static analysis
quality assurance
software testing
motion estimation algorithm
source code
image compression
artificial intelligence