Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost.

Mottaqiallah Taouil Said Hamdioui Kees Beenakker Erik Jan Marinissen

Published in: J. Electron. Test. (2012)

Keyphrases

integrated circuit
cost benefit
data sets
case study
total cost
statistical significance
testing process
social networks
multiscale
test data
massively parallel
high cost
software testing
cost reduction