Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance.
Toshio SudoPublished in: IEICE Trans. Commun. (2005)
Keyphrases
- high speed
- analog vlsi
- low cost
- low power
- single chip
- circuit design
- cmos image sensor
- power dissipation
- focal plane
- chip design
- cmos technology
- power consumption
- high density
- high frequency
- image sensor
- real time
- low power consumption
- input output
- mixed signal
- random access memory
- nm technology
- statistical tests
- vlsi implementation
- vlsi design
- low voltage
- built in self test