Login / Signup
Reliability analysis of memories protected with BICS and a per-word parity bit.
Pedro Reviriego
Juan Antonio Maestro
Chris J. Bleakley
Published in:
ACM Trans. Design Autom. Electr. Syst. (2010)
Keyphrases
</>
reliability analysis
bit parallel
co occurrence
neural network
n gram
error correction
real world
fuzzy logic
decision makers
input output
associative memory
condition monitoring
fault tree