Login / Signup

Reliability analysis of memories protected with BICS and a per-word parity bit.

Pedro ReviriegoJuan Antonio MaestroChris J. Bleakley
Published in: ACM Trans. Design Autom. Electr. Syst. (2010)
Keyphrases
  • reliability analysis
  • bit parallel
  • co occurrence
  • neural network
  • n gram
  • error correction
  • real world
  • fuzzy logic
  • decision makers
  • input output
  • associative memory
  • condition monitoring
  • fault tree