Automatic generation of memory built-in self-repair circuits in SOCs for minimizing test time and area cost.

Tsu-Wei Tseng Chih-Sheng Hou Jin-Fu Li

Published in: VTS (2010)

Keyphrases

storage overhead
total cost
high cost
analog circuits
high speed
low cost
test cases
memory requirements
memory usage
random access memory
internal memory
database
real time
computational power
cost savings