A unified method for parametric fault characterization of post-bond TSVs.
Yu-Hsiang LinShi-Yu HuangKun-Han TsaiWu-Tung ChengStephen K. SunterPublished in: ITC (2012)
Keyphrases
- preprocessing
- significant improvement
- cost function
- high accuracy
- similarity measure
- mathematical model
- experimental evaluation
- dynamic programming
- clustering method
- synthetic data
- segmentation method
- data sets
- computational cost
- classification method
- optimization method
- semi supervised
- matching algorithm
- detection method
- optimization algorithm
- main contribution
- expectation maximization
- image retrieval
- image sequences
- image segmentation
- image processing