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An electrothermally-aware full-chip substrate temperature gradient evaluation methodology for leakage dominant technologies with implications for power estimation and hot-spot management.
Sheng-Chih Lin
Kaustav Banerjee
Published in:
ICCAD (2006)
Keyphrases
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evaluation methodology
hot spots
test set
evaluation methods
test collection
high speed
evaluation metrics
evaluation measures
data management
power consumption
high density
precision and recall
user centred evaluation
query suggestion
wireless sensor networks
language model
knowledge discovery