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A novel scheme for protection of power semiconductor devices against short circuit faults.

A. K. KhargekarP. Pavana Kumar
Published in: IEEE Trans. Ind. Electron. (1994)
Keyphrases
  • short circuit
  • semiconductor devices
  • protection scheme
  • thin film
  • fault diagnosis
  • fault detection
  • electron beam
  • knowledge base
  • input output
  • power consumption
  • induction motor