A Unified Statistical Analysis of Comprehensive Fluctuations of Gate-All-Around Silicon Nanosheet MOSFETs Induced by RDF, ITF, and WKF Simultaneously.
Sekhar Reddy KolaYiming LiChieh-Yang ChenMin-Hui ChuangPublished in: ISQED (2022)
Keyphrases
- statistical analysis
- silicon dioxide
- low voltage
- cmos technology
- field effect transistors
- semantic web
- statistical methods
- data model
- leakage current
- metadata
- clinical data
- linked data
- high density
- topic maps
- high speed
- knowledge representation
- data sources
- power consumption
- low power
- markup language
- formal semantics
- rdf data
- statistical analyses
- query language
- relational databases
- knowledge base