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Connecting fabrication defects to fault models and SPICE simulations for DNA self-assembled nanoelectronics.
Vincent Mao
V. Thusu
Chris Dwyer
Krishnendu Chakrabarty
Published in:
IET Comput. Digit. Tech. (2009)
Keyphrases
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fault models
thin film transistor
model based diagnosis
dna sequences
high density
fault model
integrated circuit
horn clauses
liquid crystal displays
databases
information systems
multi agent
natural language
np hard