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An Effective Methodology for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits.
Hsing-Chung Liang
Chung-Len Lee
Published in:
Asian Test Symposium (1999)
Keyphrases
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test generation
design automation
design methodology
design process
circuit design
user interface
data sets
artificial intelligence
information systems
building blocks
computer aided design
logic circuits