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Physics-Based Retrieval of Surface Roughness Parameters for Bare Soils from Combined Active-Passive Microwave Signatures.

Anke FluhrerThomas JagdhuberDara EntekhabiMichael H. CoshPeggy O'NeillRoger H. LangIsmail Baris
Published in: IGARSS (2018)
Keyphrases
  • surface roughness
  • manufacturing process
  • specular reflection
  • image retrieval
  • deformable models
  • quality control
  • fuzzy inference system