Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs.
Tanusree KaibarttaG. P. BiswasDebesh Kumar DasPublished in: J. Electron. Test. (2020)
Keyphrases
- feature selection
- black box
- optimization problems
- global optimization
- optimal design
- neural network
- total length
- optimization process
- optimization methods
- test data
- optimization algorithm
- information systems
- test cases
- linear programming
- optimization method
- information extraction
- training data
- case study
- constrained optimization
- data mining
- discrete optimization
- real time