Substrate Parasitic Extraction for RF Integrated Circuits.
Andreia CathelinDaniel SaiasDidier BelotYouri LeclercqFrancois ClémentPublished in: DATE (2002)
Keyphrases
- integrated circuit
- electron beam
- information extraction
- radio frequency
- automatic extraction
- rf sputtering
- printed circuit boards
- high frequency
- relevance feedback
- signal processing
- automatically extracted
- image processing
- machine learning
- data mining
- automatically extracting
- semiconductor devices
- hardware description language
- real time