Cost-driven statistical analysis for selection of alternative measurements of analog circuits.
Matthieu VerdyAlin RatiuDominique MorcheEmeric de FoucauldSuzanne LesecqJean-Pascal MalletCedric MayorPublished in: ICECS (2014)
Keyphrases
- analog circuits
- statistical analysis
- digital circuits
- fault diagnosis
- wavelet packet transform
- statistical methods
- neural network
- high cost
- data driven
- measurement noise
- total cost
- minimum cost
- selection strategy
- artificial intelligence
- selection algorithm
- expected cost
- cost sensitive
- constraint satisfaction
- image processing
- machine learning