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Strategies to enhance the 3T1D-DRAM cell variability robustness beyond 22 nm.

Esteve AmatCarmen G. AlmudéverNivard AymerichRamon CanalAntonio Rubio
Published in: Microelectron. J. (2014)
Keyphrases
  • high density
  • dynamic random access memory
  • main memory
  • optimal strategy
  • genetic algorithm
  • medical images
  • high robustness