RIEMANNIAN METRIC
Experts
- Anuj Srivastava
- Baba C. Vemuri
- Shun-ichi Amari
- P. Thomas Fletcher
- Salem Said
- Xavier Pennec
- Lionel Bombrun
- Nicholas Ayache
- Eric Klassen
- Yannick Berthoumieu
- Xianfeng Gu
- Martin Bauer
- Vincent Arsigny
- Luc Florack
- Paul M. Thompson
- Michael M. Bronstein
- Ying He
- Carl-Fredrik Westin
- Laurent D. Cohen
- Andrea Fuster
- Alexey Mashtakov
- Remco Duits
- Peihua Li
- Ioana Ilea
- Tatsuaki Wada
- Pierre Fillard
- Pierre-Antoine Absil
- Dinggang Shen
- Sebastian Kurtek
- Anthony J. Yezzi
- Anastasios N. Venetsanopoulos
- Sarang C. Joshi
- Ricardo G. Sanfelice
- Laurent Praly
- Erik J. Bekkers
- Mehrtash Tafazzoli Harandi
- Mathieu Salzmann
- Laura Astola
- Martin Rumpf
Venues
- CoRR
- GSI
- Entropy
- ISBI
- IEEE Trans. Vis. Comput. Graph.
- MICCAI (1)
- NeuroImage
- IEEE Trans. Signal Process.
- ICCV
- ICASSP
- J. Multivar. Anal.
- CVPR
- IPMI
- SIAM J. Imaging Sci.
- J. Math. Imaging Vis.
- IEEE Trans. Medical Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- SIAM J. Matrix Anal. Appl.
- CVPR Workshops
- Pattern Recognit.
- Comput. Graph. Forum
- IEEE Visualization
- Comput. Aided Des.
- Medical Imaging: Image Processing
- SIAM J. Math. Anal.
- Int. J. Comput. Vis.
- Appl. Math. Comput.
- ICIP
- NeurIPS
- Exp. Math.
- ICML
- SIAM J. Control. Optim.
- ICCV Workshops
- Comput. Aided Geom. Des.
- Symmetry
- Int. J. Math. Math. Sci.
- J. Comput. Appl. Math.
- Medical Image Anal.
- IEEE Access
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