RIEMANNIAN METRIC
Experts
- Anuj Srivastava
- Shun-ichi Amari
- Baba C. Vemuri
- P. Thomas Fletcher
- Xavier Pennec
- Lionel Bombrun
- Salem Said
- Nicholas Ayache
- Eric Klassen
- Martin Bauer
- Xianfeng Gu
- Yannick Berthoumieu
- Vincent Arsigny
- Michael M. Bronstein
- Paul M. Thompson
- Luc Florack
- Pierre-Antoine Absil
- Alexey Mashtakov
- Dinggang Shen
- Andrea Fuster
- Tatsuaki Wada
- Ying He
- Pierre Fillard
- Peihua Li
- Remco Duits
- Carl-Fredrik Westin
- Ioana Ilea
- Laurent D. Cohen
- Sebastian Kurtek
- Erik J. Bekkers
- Laurent Praly
- Martin Rumpf
- Ricardo G. Sanfelice
- Anthony J. Yezzi
- Maher Moakher
- Marco Congedo
- Anastasios N. Venetsanopoulos
- Mehrtash Tafazzoli Harandi
- Mathieu Salzmann
Venues
- CoRR
- GSI
- ISBI
- Entropy
- MICCAI (1)
- IEEE Trans. Vis. Comput. Graph.
- IEEE Trans. Signal Process.
- ICCV
- NeuroImage
- J. Multivar. Anal.
- ICASSP
- CVPR
- SIAM J. Imaging Sci.
- IPMI
- J. Math. Imaging Vis.
- IEEE Trans. Medical Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- SIAM J. Matrix Anal. Appl.
- CVPR Workshops
- Comput. Graph. Forum
- Comput. Aided Des.
- Medical Imaging: Image Processing
- IEEE Visualization
- Appl. Math. Comput.
- SIAM J. Math. Anal.
- NeurIPS
- Int. J. Comput. Vis.
- ICIP
- ICCV Workshops
- Comput. Aided Geom. Des.
- Symmetry
- Int. J. Math. Math. Sci.
- Exp. Math.
- ICML
- SIAM J. Control. Optim.
- EMMCVPR
- EUSIPCO
- AAAI
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