RESIDUAL IMAGE
Experts
- Matt Wolff
- Ender Ayanoglu
- Glenn Chisholm
- Michael Wojnowicz
- Xiaofei Du
- Ping An
- Yuan Yan Tang
- Liquan Shen
- Maria Robu
- Pavlos Mavridis
- Danail Stoyanov
- David S. Doermann
- Wenzhu Xing
- Emanuele Viterbo
- Ran Ma
- Georgios Papaioannou
- Yi Hong
- Ana B. Ramirez
- André Kaup
- Neil T. Clancy
- Ruey-Yi Wei
- Deyang Liu
- Omid E. Kia
- Geoffrey Jones
- Yu-Chih Huang
- Gonzalo R. Arce
- Hsueh-Ming Hang
- Daniel S. Elson
- Xuan Zhao
- Chang-Chih Huang
- Brian M. Sadler
- Azeddine Beghdadi
- Chao Yang
- Simon R. Arridge
- Karen O. Egiazarian
- Yun Hee Kim
- David Herbert
- Zhifeng Lin
- Juh-Wei Chung
Venues
- CoRR
- ICASSP
- IEEE Trans. Commun.
- IEEE Access
- ISIT
- ISNN (1)
- IEEE Trans. Veh. Technol.
- VTC Spring
- EMBC
- GLOBECOM
- Pattern Recognit.
- ICIP (3)
- Signal Process. Image Commun.
- Inf. Sci.
- J. Electronic Imaging
- ICC
- ICIP
- Int. J. Pattern Recognit. Artif. Intell.
- WCNC
- ICME
- EUVIP
- ISCAS
- IEEE Trans. Image Process.
- VCIP
- Image Process. Line
- IET Image Process.
- IJCNN
- IEEE Trans. Inf. Theory
- ISCCSP
- ICPR
- ICIP (1)
- ISGT
- ISIVC
- IEEE Trans. Consumer Electron.
- ICNC (5)
- DASFAA (Workshops)
- IEEE Commun. Mag.
- Comput. Graph. Forum
- SIGGRAPH Posters
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