REFLECTION COMPONENTS
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Pieter Peers
- Takahiro Okabe
- Katsushi Ikeuchi
- Ko Nishino
- Heung-Yeung Shum
- Lawrence B. Wolff
- Stephen Lin
- Tongbo Chen
- Tetsuo Miyake
- Sijia Wen
- Matan Sela
- Luc Van Gool
- Kenji Hara
- Feng Lu
- Qifeng Chen
- Xin Tong
- Xi-Sheng Fang
- Saad Nadeem
- Daniel Cohen-Or
- Arie E. Kaufman
- Takayuki Okatani
- Zhong Zhang
- Pedro Latorre Carmona
- Francisco Ortiz
- Joseph W. Sapp
- Zorana Jelenak
- Terrance E. Boult
- Theo Gevers
- Jianwei Yang
- Shree K. Nayar
- Shihao Wu
- Masatoshi Okutomi
- Stamatios Georgoulis
- Imari Sato
- Xuaner Cecilia Zhang
- Edwin R. Hancock
- Osamu Ikeda
Venues
- CoRR
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- Color Imaging Conference
- IEEE Trans. Image Process.
- ICIP
- MVA
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Trans. Graph.
- Remote. Sens.
- WACV
- Comput. Graph. Forum
- VMV
- PIMRC
- IGARSS
- Sensors
- ICCV
- CIC
- CVPR (1)
- SIGGRAPH Posters
- ICIAR
- J. Imaging
- Color Imaging: Processing, Hardcopy, and Applications
- IEEE Trans. Signal Process.
- OFC
- Pattern Recognit. Lett.
- Pattern Recognit.
- CAIP
- VISAPP (1)
- IEEE Geosci. Remote. Sens. Lett.
- ICCP
- Vis. Comput.
- ECCV (4)
- NCVPRIPG
- Int. J. Comput. Vis.
- ACCV (5)
- ICRA
- ISMAR Adjunct
- SIGGRAPH Talks
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