REFLECTION COMPONENTS
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Takahiro Okabe
- Katsushi Ikeuchi
- Pieter Peers
- Heung-Yeung Shum
- Stephen Lin
- Lawrence B. Wolff
- Ko Nishino
- Chang-Hwan Son
- Pedro Latorre Carmona
- Tongbo Chen
- Mario Fritz
- Osamu Ikeda
- Qifeng Chen
- Zorana Jelenak
- Hui Huang
- Shawn Mathew
- Xi-Sheng Fang
- Paul S. Chang
- Sijia Wen
- Konstantinos Rematas
- Matthias Zwicker
- Shree K. Nayar
- Zhong Zhang
- Graham Fyffe
- Tobias Ritschel
- Miki Morimatsu
- Yusuke Monno
- Francisco Ortiz
- Giuseppe Claudio Guarnera
- Matan Sela
- Luc Van Gool
- Tesuo Kiuchi
- Ron Kimmel
- Stamatios Georgoulis
- Joseph W. Sapp
- Tinne Tuytelaars
- Kosuke Sato
Venues
- CoRR
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- Color Imaging Conference
- IEEE Trans. Image Process.
- ICIP
- ACM Trans. Graph.
- MVA
- IEEE Trans. Pattern Anal. Mach. Intell.
- WACV
- Remote. Sens.
- IGARSS
- VMV
- CVPR (1)
- ICIAR
- Sensors
- PIMRC
- J. Imaging
- SIGGRAPH Posters
- Comput. Graph. Forum
- ICCV
- CIC
- Reflection
- IEICE Trans. Inf. Syst.
- CVCS
- IEICE Electron. Express
- IW-FCV
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Vis. Comput.
- ROBIO
- EGSR (EI&I)
- MICCAI (8)
- Color Imaging: Processing, Hardcopy, and Applications
- IVMSP
- Pattern Recognit. Lett.
- EURASIP J. Wirel. Commun. Netw.
- ACCV (4)
- CGIV
- ICCV Workshops
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