REFLECTION COMPONENTS
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Katsushi Ikeuchi
- Pieter Peers
- Takahiro Okabe
- Heung-Yeung Shum
- Ko Nishino
- Lawrence B. Wolff
- Stephen Lin
- Kun-Shan Chen
- Yeong-Ho Ha
- Daniel Cohen-Or
- Robby T. Tan
- Miki Morimatsu
- Imari Sato
- Stamatios Georgoulis
- Graham Fyffe
- Stephen J. Frasier
- Joseph W. Sapp
- Konstantinos Rematas
- Matan Sela
- Edwin R. Hancock
- Shawn Mathew
- Takashi Imamura
- Paul S. Chang
- Xuaner Cecilia Zhang
- Ron Kimmel
- Qifeng Chen
- Yusuke Monno
- Chang-Hwan Son
- Takayuki Okatani
- Tinne Tuytelaars
- Arie E. Kaufman
- Tiziano Portenier
- Xin Tong
- Tongbo Chen
- Jianwei Yang
- Xi-Sheng Fang
- Masayuki Tanaka
Venues
- CoRR
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- Color Imaging Conference
- IEEE Trans. Image Process.
- ICIP
- MVA
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- WACV
- ICIAR
- VMV
- IGARSS
- SIGGRAPH Posters
- CIC
- ICCV
- Sensors
- PIMRC
- J. Imaging
- CVPR (1)
- Comput. Graph. Forum
- ACCV (5)
- CAIP
- IEEE Trans. Signal Process.
- VISAPP (1)
- ACCV (4)
- ISMAR Adjunct
- IVMSP
- ICASSP
- ICIP (3)
- EMEIT
- HPSR
- IEEE Trans. Instrum. Meas.
- Pattern Recognit.
- ICIAR (1)
- Comput. Vis. Image Underst.
- IEEE Trans. Syst. Man Cybern. Syst.
- SIGGRAPH Talks
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