REFLECTION COMPONENTS
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Katsushi Ikeuchi
- Pieter Peers
- Takahiro Okabe
- Stephen Lin
- Ko Nishino
- Lawrence B. Wolff
- Heung-Yeung Shum
- Hui Huang
- Matthias Zwicker
- Takashi Imamura
- Kun-Shan Chen
- Yusuke Monno
- Arie E. Kaufman
- Daniel Cohen-Or
- Konstantinos Rematas
- Stamatios Georgoulis
- Saad Nadeem
- Shawn Mathew
- Ron Kimmel
- Feng Lu
- Paul S. Chang
- Matan Sela
- Graham Fyffe
- Luc Van Gool
- Takayuki Okatani
- Xin Tong
- Ren Ng
- Miki Morimatsu
- Giuseppe Claudio Guarnera
- Pedro Latorre Carmona
- Kenji Hara
- Tesuo Kiuchi
- Zhong Zhang
- Jun-ichi Takada
- Tinne Tuytelaars
- Xi-Sheng Fang
- Jianwei Yang
Venues
- CoRR
- CVPR
- Color Imaging Conference
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Image Process.
- MVA
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICIP
- WACV
- Remote. Sens.
- ICIAR
- ICCV
- CIC
- Sensors
- CVPR (1)
- IGARSS
- SIGGRAPH Posters
- Comput. Graph. Forum
- PIMRC
- VMV
- J. Imaging
- IEICE Trans. Inf. Syst.
- CGIV
- EURASIP J. Wirel. Commun. Netw.
- Comput. Vis. Image Underst.
- ECCV (4)
- MICCAI (8)
- IEEE Trans. Syst. Man Cybern. Syst.
- ICIAR (1)
- Inf. Media Technol.
- ICCP
- ICRA
- Color Imaging: Processing, Hardcopy, and Applications
- ECCV Workshops (3)
- IScIDE
- OFC
- CAIP
- SCCG
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