REFERENCE POINTS
Experts
- Anil K. Jain
- Hisao Ishibuchi
- Jie Tian
- Jianjiang Feng
- Kai Cao
- Yusuke Nojima
- Venu Govindaraju
- Xin Yang
- Eryun Liu
- Christoph Busch
- Jin Qi
- Reynold J. Bailey
- Josef Bigün
- Yangsheng Wang
- Jie Zhou
- Ann McNamara
- Jianjun Zhu
- Bir Bhanu
- Jianping Yin
- Cindy Grimm
- En Zhu
- Arun Ross
- Steven A. Grosz
- Dong Sun Park
- Mengjie Zhang
- Krzysztof Wrobel
- Jose Manuel Cabello
- Nalini K. Ratha
- Ruud M. Bolle
- Wlodzimierz Ogryczak
- Francisco Ruiz
- Xudong Jiang
- Sook Yoon
- Ryo Imada
- Ryoji Tanabe
- Xuejun Tan
- Javier Ortega-Garcia
- Sharath Pankanti
- Liaojun Pang
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICB
- IEEE Trans. Inf. Forensics Secur.
- Eur. J. Oper. Res.
- IEEE Access
- ICPR
- Manag. Sci.
- Sensors
- ICIP
- Pattern Recognit. Lett.
- Inf. Sci.
- IROS
- AVBPA
- IEEE Trans. Evol. Comput.
- ICBA
- CEC
- ICASSP
- J. Oper. Res. Soc.
- Appl. Soft Comput.
- SMC
- BIOSIG
- Multim. Tools Appl.
- Swarm Evol. Comput.
- Int. J. Biom.
- J. Inf. Process. Syst.
- Symmetry
- EMO
- Expert Syst. Appl.
- J. Electronic Imaging
- ICVGIP
- ICPR (1)
- Oper. Res.
- Int. J. Comput. Vis.
- Entropy
- Appl. Intell.
- Image Vis. Comput.
- DGCI
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