REFERENCE POINTS
Experts
- Anil K. Jain
- Hisao Ishibuchi
- Jie Tian
- Jianjiang Feng
- Kai Cao
- Venu Govindaraju
- Yusuke Nojima
- Xin Yang
- Christoph Busch
- Jin Qi
- Eryun Liu
- Bir Bhanu
- En Zhu
- Ann McNamara
- Cindy Grimm
- Yangsheng Wang
- Jianping Yin
- Josef Bigün
- Reynold J. Bailey
- Jie Zhou
- Jianjun Zhu
- Jose Manuel Cabello
- Xudong Jiang
- Kalyanmoy Deb
- Ryo Imada
- Wlodzimierz Ogryczak
- Ryoji Tanabe
- Sharath Pankanti
- Arun Ross
- Mengjie Zhang
- Sook Yoon
- Steven A. Grosz
- Xuejun Tan
- Nalini K. Ratha
- Krzysztof Wrobel
- Javier Ortega-Garcia
- Dong Sun Park
- Ruud M. Bolle
- Liaojun Pang
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICB
- IEEE Trans. Inf. Forensics Secur.
- Eur. J. Oper. Res.
- ICPR
- IEEE Access
- ICIP
- Pattern Recognit. Lett.
- Sensors
- Manag. Sci.
- Inf. Sci.
- IROS
- ICBA
- AVBPA
- CEC
- ICASSP
- SMC
- BIOSIG
- J. Oper. Res. Soc.
- IEEE Trans. Evol. Comput.
- Multim. Tools Appl.
- Swarm Evol. Comput.
- Int. J. Biom.
- EMO
- Int. J. Comput. Vis.
- Oper. Res.
- Expert Syst. Appl.
- J. Inf. Process. Syst.
- J. Electronic Imaging
- ICPR (1)
- ICVGIP
- Appl. Soft Comput.
- IET Biom.
- Symmetry
- Entropy
- ICIP (2)
- ICRA
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