POINT LIGHT SOURCE
Experts
- Roberto Mecca
- Yasuyuki Matsushita
- Dimitris Samaras
- Katsushi Ikeuchi
- Pieter Peers
- Paul E. Debevec
- Takahiro Okabe
- Edwin R. Hancock
- Ravi Ramamoorthi
- Yvain Quéau
- Ko Nishino
- Roberto Cipolla
- Yuji Iwahori
- Imari Sato
- Fotios Logothetis
- Takashi Matsuyama
- Jonathan T. Barron
- Daniel Cremers
- Osamu Ikeda
- Alfred M. Bruckstein
- Koichiro Deguchi
- Yoichi Sato
- Philip L. Worthington
- Jean-Denis Durou
- Takayuki Okatani
- Lyndon N. Smith
- Salma Jiddi
- Ron Kimmel
- Yang Wang
- Ryszard Kozera
- Michael Breuß
- David J. Kriegman
- Ham M. Rara
- Philippe Robert
- Lei Zhang
- Maria Petrou
- Aly A. Farag
- Melvyn L. Smith
- Shireen Y. Elhabian
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- BMVC
- ICIP
- Comput. Vis. Image Underst.
- 3DV
- ICPR
- ACM Trans. Graph.
- Comput. Graph. Forum
- Systems and Computers in Japan
- SIGGRAPH Posters
- MVA
- Image Vis. Comput.
- Pattern Recognit.
- IEICE Electron. Express
- IEEE Trans. Vis. Comput. Graph.
- IEEE Trans. Image Process.
- CVPR (1)
- ECCV (1)
- Remote. Sens.
- Rendering Techniques
- CIC
- Comput. Graph.
- Displays
- WACV
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Sensors
- ISUVR
- ECCV (2)
- Color Imaging Conference
- Multim. Tools Appl.
- CRV
- IGARSS
- ICCVG
- IEICE Trans. Inf. Syst.
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