POINT LIGHT SOURCE
Experts
- Roberto Mecca
- Dimitris Samaras
- Yasuyuki Matsushita
- Pieter Peers
- Katsushi Ikeuchi
- Edwin R. Hancock
- Takahiro Okabe
- Paul E. Debevec
- Ravi Ramamoorthi
- Roberto Cipolla
- Ko Nishino
- Yvain Quéau
- Imari Sato
- Yuji Iwahori
- Fotios Logothetis
- Daniel Cremers
- Takashi Matsuyama
- Koichiro Deguchi
- Takayuki Okatani
- Philip L. Worthington
- Osamu Ikeda
- Jean-Denis Durou
- Jonathan T. Barron
- Yoichi Sato
- Alfred M. Bruckstein
- Xin Tong
- William A. P. Smith
- Aly A. Farag
- Abhijeet Ghosh
- Melvyn L. Smith
- Ronen Basri
- Ryo Kawahara
- Ron Kimmel
- David J. Kriegman
- Shireen Y. Elhabian
- Ham M. Rara
- Philippe Robert
- Yang Wang
- Salma Jiddi
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- BMVC
- ICIP
- Comput. Vis. Image Underst.
- ICPR
- ACM Trans. Graph.
- 3DV
- Comput. Graph. Forum
- Systems and Computers in Japan
- SIGGRAPH Posters
- IEEE Trans. Image Process.
- IEICE Electron. Express
- Pattern Recognit.
- Image Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- MVA
- IEEE Access
- CVPR (1)
- Displays
- IEEE Trans. Instrum. Meas.
- Sensors
- WACV
- Remote. Sens.
- CIC
- Rendering Techniques
- Comput. Graph.
- ECCV (1)
- EUSIPCO
- Color Imaging Conference
- ECCV (2)
- J. Electronic Imaging
- SIBGRAPI
- IEICE Trans. Inf. Syst.
- SIAM J. Imaging Sci.
- Multim. Tools Appl.
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