POINT LIGHT SOURCE
Experts
- Roberto Mecca
- Dimitris Samaras
- Yasuyuki Matsushita
- Katsushi Ikeuchi
- Pieter Peers
- Paul E. Debevec
- Takahiro Okabe
- Edwin R. Hancock
- Roberto Cipolla
- Yvain Quéau
- Ravi Ramamoorthi
- Ko Nishino
- Yuji Iwahori
- Imari Sato
- Jonathan T. Barron
- Jean-Denis Durou
- Philip L. Worthington
- Alfred M. Bruckstein
- Daniel Cremers
- Osamu Ikeda
- Yoichi Sato
- Takayuki Okatani
- Fotios Logothetis
- Takashi Matsuyama
- Koichiro Deguchi
- Lyndon N. Smith
- Ham M. Rara
- Maria Petrou
- Fredric Solomon
- Yang Wang
- Shireen Y. Elhabian
- Ron Kimmel
- Ryo Kawahara
- Lei Zhang
- Ryszard Kozera
- Melvyn L. Smith
- Xin Tong
- Ronen Basri
- Salma Jiddi
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- BMVC
- ICIP
- Comput. Vis. Image Underst.
- 3DV
- ICPR
- ACM Trans. Graph.
- Comput. Graph. Forum
- Systems and Computers in Japan
- SIGGRAPH Posters
- Pattern Recognit.
- IEEE Trans. Vis. Comput. Graph.
- Image Vis. Comput.
- IEICE Electron. Express
- IEEE Trans. Image Process.
- MVA
- CVPR (1)
- Sensors
- Rendering Techniques
- CIC
- Comput. Graph.
- Remote. Sens.
- Displays
- IEEE Access
- WACV
- IEEE Trans. Instrum. Meas.
- ECCV (1)
- IGARSS
- ICRA
- ICPR (1)
- SIAM J. Imaging Sci.
- EUSIPCO
- CRV
- ICCVG
- Multim. Tools Appl.
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