POINT LIGHT SOURCE
Experts
- Roberto Mecca
- Yasuyuki Matsushita
- Dimitris Samaras
- Pieter Peers
- Katsushi Ikeuchi
- Edwin R. Hancock
- Takahiro Okabe
- Paul E. Debevec
- Roberto Cipolla
- Yvain Quéau
- Ko Nishino
- Ravi Ramamoorthi
- Imari Sato
- Yuji Iwahori
- Koichiro Deguchi
- Yoichi Sato
- Jean-Denis Durou
- Philip L. Worthington
- Takayuki Okatani
- Alfred M. Bruckstein
- Fotios Logothetis
- Daniel Cremers
- Jonathan T. Barron
- Takashi Matsuyama
- Osamu Ikeda
- Ryo Kawahara
- William A. P. Smith
- Fredric Solomon
- Xin Tong
- Ronen Basri
- Lei Zhang
- Maria Petrou
- Philippe Robert
- Melvyn L. Smith
- Aly A. Farag
- Shireen Y. Elhabian
- Abhijeet Ghosh
- Yang Wang
- David J. Kriegman
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- BMVC
- Int. J. Comput. Vis.
- ICIP
- Comput. Vis. Image Underst.
- Comput. Graph. Forum
- ACM Trans. Graph.
- ICPR
- 3DV
- Systems and Computers in Japan
- Pattern Recognit.
- Image Vis. Comput.
- MVA
- SIGGRAPH Posters
- IEEE Trans. Image Process.
- IEEE Trans. Vis. Comput. Graph.
- IEICE Electron. Express
- Rendering Techniques
- Remote. Sens.
- ECCV (1)
- CVPR (1)
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- WACV
- Displays
- Comput. Graph.
- CIC
- IGARSS
- CRV
- Multim. Tools Appl.
- Color Imaging Conference
- ECCV (2)
- ISUVR
- PG
- EUSIPCO
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