MEASURING SEMANTIC SIMILARITY
Experts
- Peter D. Turney
- Hugo GonƧalo Oliveira
- Roxana Girju
- Danushka Bollegala
- Thomas C. Rindflesch
- Mitsuru Ishizuka
- Laura Hollink
- Keith J. Holyoak
- Enrico Motta
- Stan Szpakowicz
- Hisham Al-Mubaid
- Hoa A. Nguyen
- Dan Roth
- Preslav Nakov
- Alla Rozovskaya
- Ted Pedersen
- Yutaka Matsuo
- Guus Schreiber
- Dimitar Hristovski
- Gaƫl Dias
- Natalia Stash
- Yiwen Wang
- Michael Sirivianos
- David Jurgens
- Pierluigi Cassotti
- Fatih Porikli
- Velislava Stoykova
- JosƩ Luis Ambite
- Diarmuid Ć SĆ©aghdha
- Suma Bhat
- Maciej Piasecki
- Hatem M. Abdelkader
- Alexander F. Gelbukh
- Paul Nulty
- Siddharth Patwardhan
- Xiaoyong Du
- Angela Schwering
- Marius Paraschiv
- Nina Tahmasebi
Venues
- CoRR
- LREC
- SemEval@ACL
- GWC
- RANLP
- COLING
- ACL
- AMIA
- SIGIR
- Web Intelligence
- IRI
- SemEval@NAACL-HLT
- IEEE Access
- EACL
- SKG
- J. Cogn. Neurosci.
- Inf. Process. Manag.
- IEEE Trans. Knowl. Data Eng.
- Int. J. Comput. Appl. Technol.
- ISWC (1)
- CICLing
- ICCCI
- J. Lang. Model.
- iiWAS
- Int. J. Inf. Retr. Res.
- WordNet@ACL/COLING
- EMNLP (1)
- ComputaciĆ³n y Sistemas
- J. Intell. Fuzzy Syst.
- HLT/EMNLP
- ACL (1)
- PROPOR
- ASIST
- CogALex@COLING
- CogSci
- KEOD
- Informatica (Slovenia)
- AAAI
- AICCSA
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