MEASURING SEMANTIC SIMILARITY
Experts
- Peter D. Turney
- Hugo Gonçalo Oliveira
- Roxana Girju
- Danushka Bollegala
- Thomas C. Rindflesch
- Mitsuru Ishizuka
- Dan Roth
- Ted Pedersen
- Gaël Dias
- Alla Rozovskaya
- Keith J. Holyoak
- Stan Szpakowicz
- Preslav Nakov
- Hoa A. Nguyen
- Laura Hollink
- Guus Schreiber
- Yutaka Matsuo
- Hisham Al-Mubaid
- Enrico Motta
- Dimitar Hristovski
- Pedro A. Szekely
- David Pinto
- Zhe Zhao
- Maxim Mozgovoy
- Nikolaos Laoutaris
- Hozumi Tanaka
- Craig A. Knoblock
- Mohamed Ali Hadj Taieb
- Bryan Rink
- Nikos Salamanos
- Sanda M. Harabagiu
- Renfen Hu
- Hong Cai
- Siddharth Patwardhan
- David Jurgens
- Masaki Aono
- Xiaoping Yang
- Julien Kloetzer
- Yiwen Wang
Venues
- CoRR
- LREC
- SemEval@ACL
- GWC
- COLING
- RANLP
- SIGIR
- ACL
- AMIA
- Web Intelligence
- IEEE Trans. Knowl. Data Eng.
- SKG
- EACL
- IRI
- IEEE Access
- SemEval@NAACL-HLT
- J. Cogn. Neurosci.
- Inf. Process. Manag.
- ISWC (1)
- CogSci
- CICLing
- Int. J. Inf. Retr. Res.
- AAAI
- WordNet@ACL/COLING
- J. Intell. Fuzzy Syst.
- J. Lang. Model.
- Computación y Sistemas
- Int. J. Comput. Appl. Technol.
- iiWAS
- CogALex@COLING
- IHCI
- Informatica (Slovenia)
- KEOD
- ACL (1)
- AICCSA
- HLT/EMNLP
- EMNLP (1)
- ICCCI
- CVPR
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