GEOMETRIC METHODS
Experts
- Josef Kittler
- Mark B. Sandler
- Mauro Carlo Beltrametti
- Anna Maria Massone
- Nahum Kiryati
- John Illingworth
- Emilio L. Zapata
- Mark S. Nixon
- Alfred M. Bruckstein
- Nicolás Guil
- Zhanyi Hu
- Cristina Campi
- Hiroyasu Koshimizu
- Raymond K. K. Yip
- Azriel Rosenfeld
- Maria-Laura Torrente
- Dmitry P. Nikolaev
- Elena Zattoni
- D. Ben-Tzvi
- Yasuaki Ito
- Luciano da Fontoura Costa
- Anastasios L. Kesidis
- Wan-Chi Siu
- Mohammed Atiquzzaman
- Kazuhito Murakami
- Songde Ma
- Atsushi Imiya
- Rita Cucchiara
- Dimitrios Ioannou
- Ravi Kumar Satzoda
- Dennis N. K. Leung
- Thambipillai Srikanthan
- John N. Carter
- Nikos Papamarkos
- Bernard Kapidani
- Luc Van Gool
- Koji Nakano
- Sartaj Sahni
- Isaac Weiss
Venues
- Pattern Recognit. Lett.
- CoRR
- Pattern Recognit.
- Image Vis. Comput.
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Comput. Vis. Image Underst.
- Real Time Imaging
- Comput. Vis. Graph. Image Process.
- Sensors
- ICPR (2)
- ICIP
- Systems and Computers in Japan
- EUSIPCO
- ICIP (2)
- MVA
- CVPR
- IEEE Trans. Image Process.
- J. Parallel Distributed Comput.
- BMVC
- ICPR (1)
- Mach. Vis. Appl.
- Alvey Vision Conference
- ICPR (3)
- FUSION
- DAGM-Symposium
- ISCAS
- IEEE Geosci. Remote. Sens. Lett.
- Microprocess. Microsystems
- J. Math. Imaging Vis.
- ICCV
- ECCV (1)
- Int. J. Pattern Recognit. Artif. Intell.
- SCG
- ICRA
- IPTA
- SIU
- Robotics Auton. Syst.
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