FALSE DETECTION RATE
Experts
- Marcel Medwed
- Emanuele Grossi
- Marco Lops
- Luca Venturino
- Chengyu Ju
- Leonardo Bonato Felix
- Joana Frontera-Pons
- Costas Neocleous
- Norwati Mustapha
- Xu-Yao Zhang
- Marcel Kyas
- Jörn-Marc Schmidt
- Haopu Shang
- Adeel Razi
- Dorit Merhof
- Jyotish N. P. Singh
- R. S. Bhatia
- Vincent Heuveline
- Laura Verde
- Eduardo Mazoni Andrade Marçal Mendes
- Junichi Honda
- António dos Anjos
- Simon Hoermann
- Abdelkrim Haqiq
- Takuya Otsuyama
- Tao Ma
- Susanne Kandl
- Mary Wilson
- Pascal Bouvry
- Pamela Mancuso
- Raimund Kirner
- Michael Berks
- Muath A. Wahdan
- I-Lin Tang
- Chun-Hsuan Chang
- Pierpaolo Pattacini
- Cheng-Lin Liu
- Philip O'Kane
- J. M. Kim
Venues
- CoRR
- IEEE Access
- AISI
- IACR Cryptol. ePrint Arch.
- Medical Biol. Eng. Comput.
- EURASIP J. Adv. Signal Process.
- IEEE Trans. Inf. Theory
- Int. J. Pattern Recognit. Artif. Intell.
- IJCNN
- WACV
- Trans. Emerg. Telecommun. Technol.
- ICTCC
- ICSPCC
- FDTC
- GIL Jahrestagung
- ICIT
- UIST
- SIU
- Digital Mammography / IWDM
- Comput. Phys. Commun.
- CogSci
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Signal Process. Lett.
- NBiS
- Int. J. Parallel Emergent Distributed Syst.
- J. Digit. Imaging
- Neural Process. Lett.
- ISBI
- NeuroImage
- GCCE
- Softw. Test. Verification Reliab.
- Sensors
- SAC
- IET Softw.
- IEEE Trans. Smart Grid
- IEEE Trans. Commun.
- IPDPS Workshops
- Soft Comput.
- IRC
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