FALSE DETECTION RATE
Experts
- Marco Lops
- Luca Venturino
- Emanuele Grossi
- Marcel Medwed
- Joana Frontera-Pons
- Leonardo Bonato Felix
- Fei Zhu
- Eul Gyu Im
- Sara Ravaioli
- Muath A. Wahdan
- Chengcheng Zhao
- Julie Morris
- Hadi Veisi
- Thomas Anken
- Tao Ma
- Joschka zur Jacobsmühlen
- Kieran McLaughlin
- Eduardo Mazoni Andrade Marçal Mendes
- Jijun Liu
- Qun Chen
- Takahiro Ogawa
- Jörn-Marc Schmidt
- I-Lin Tang
- Ehtesham Iqbal
- Haopu Shang
- Pankaj Gupta
- Raimund Kirner
- Antônio Maurício Ferreira Leite Miranda de Sá
- Soumen Nayak
- Kwang Nam Choi
- Chiranjeev Kumar
- Cinzia Campari
- Marcel Kyas
- Michael L. Honig
- Md Nasir Sulaiman
- Giovanni Emanuele Corazza
- Joshua Springer
- Tiago Zanotelli
- Sakir Sezer
Venues
- CoRR
- IEEE Access
- IPDPS Workshops
- FDTC
- SAC
- J. Digit. Imaging
- ICSPCC
- CogSci
- IEEE Trans. Aerosp. Electron. Syst.
- Digital Mammography / IWDM
- Int. J. Syst. Assur. Eng. Manag.
- J. Comput. Appl. Math.
- SIU
- IET Signal Process.
- NeuroImage
- EURASIP J. Adv. Signal Process.
- IEEE Trans. Commun.
- SEUS
- Trans. Emerg. Telecommun. Technol.
- IRC
- EICC
- Softw. Test. Verification Reliab.
- TrustCom/BigDataSE/ISPA (2)
- ICCCV
- Medical Biol. Eng. Comput.
- Neural Process. Lett.
- WACV
- NBiS
- Frontiers Inf. Technol. Electron. Eng.
- ICASSP
- IACR Cryptol. ePrint Arch.
- IEEE Trans. Smart Grid
- Int. J. Parallel Emergent Distributed Syst.
- ICTCC
- Int. J. Pattern Recognit. Artif. Intell.
- Soft Comput.
- Eng. Appl. Artif. Intell.
- IJCNN
- IEEE Signal Process. Lett.
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