FALSE DETECTION RATE
Experts
- Emanuele Grossi
- Marcel Medwed
- Luca Venturino
- Marco Lops
- Chongrong Fang
- Daniel H. Stolfi
- D. K. Jain
- Gholam-Ali Hossein-Zadeh
- A. Semenov
- Miki Haseyama
- Laura Verde
- Michael Berks
- Christos N. Schizas
- Raymond N. J. Veldhuis
- Peter Lightbody
- Hamid Reza Shahbazkia
- Tomás Krajník
- Rong-Chang Chen
- Antônio Maurício Ferreira Leite Miranda de Sá
- Anton H. M. Akkermans
- Andreas C. Neocleous
- R. S. Bhatia
- Jingpei Wang
- Leonardo Bonato Felix
- Thomas Anken
- Tiago Zanotelli
- Hamid Soltanian-Zadeh
- Doo Hee Lee
- Susan M. Astley
- Costas Neocleous
- Simon Hoermann
- Jessie S. Jeon
- Jan Achterhold
- Paolo Giorgi Rossi
- Chun Chen
- Muhammad Syafiq Mohd Pozi
- G. Bélanger
- Hyun Chul Song
- Tung-Shou Chen
Venues
- IEEE Access
- CoRR
- ICASSP
- IJCNN
- Sensors
- IEEE Signal Process. Lett.
- IRC
- Int. J. Parallel Emergent Distributed Syst.
- SAC
- ISBI
- IET Softw.
- IEEE Trans. Inf. Theory
- EURASIP J. Adv. Signal Process.
- J. Digit. Imaging
- IPDPS Workshops
- WACV
- Digital Mammography / IWDM
- IET Signal Process.
- NBiS
- IEEE Trans. Smart Grid
- Soft Comput.
- Softw. Test. Verification Reliab.
- Frontiers Inf. Technol. Electron. Eng.
- SIU
- IEEE Trans. Aerosp. Electron. Syst.
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Trans. Commun.
- IACR Cryptol. ePrint Arch.
- AISI
- GIL Jahrestagung
- Medical Biol. Eng. Comput.
- CogSci
- ICTCC
- GCCE
- ICCCV
- FDTC
- TrustCom/BigDataSE/ISPA (2)
- Trans. Emerg. Telecommun. Technol.
- Neural Process. Lett.
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