FALSE DETECTION RATE
Experts
- Emanuele Grossi
- Marcel Medwed
- Marco Lops
- Luca Venturino
- Fumihiko Taya
- Michael Berks
- Jianping He
- Laura Verde
- Sachin Tripathi
- Nicolai Petkov
- Raimund Kirner
- O'Dhaniel A. Mullette-Gillman
- Ahmed Ghoneim
- Upamanyu Madhow
- Anton H. M. Akkermans
- Doo Hee Lee
- Andreas C. Neocleous
- Pierpaolo Pattacini
- Adarsh Anand
- Raymond N. J. Veldhuis
- Antônio Maurício Ferreira Leite Miranda de Sá
- Giuseppe De Pietro
- Hyun Chul Song
- Andrea Nitrosi
- Jieum Hyun
- Christos N. Schizas
- Simon Hoermann
- Mubarak Alrashoud
- Xiaoxia Hou
- Nicola Barr
- Abdelkrim Haqiq
- Joana Frontera-Pons
- Dorit Merhof
- Frédéric Pascal
- Leonardo Bonato Felix
- Hadi Veisi
- Pawel Andrzej Herman
- Zhiyu He
- Antonella Cattani
Venues
- CoRR
- IEEE Access
- Int. J. Syst. Assur. Eng. Manag.
- Eng. Appl. Artif. Intell.
- SEUS
- Int. J. Pattern Recognit. Artif. Intell.
- IEEE Signal Process. Lett.
- UIST
- GIL Jahrestagung
- Comput. Phys. Commun.
- NeuroImage
- ISBI
- IJCNN
- EURASIP J. Adv. Signal Process.
- WACV
- IEEE Trans. Inf. Theory
- IEEE Trans. Commun.
- J. Comput. Appl. Math.
- Medical Biol. Eng. Comput.
- Digital Mammography / IWDM
- FDTC
- CogSci
- IET Softw.
- EICC
- IPDPS Workshops
- IACR Cryptol. ePrint Arch.
- ICSPCC
- ICTCC
- ICCCV
- ICIT
- Neural Process. Lett.
- Sensors
- Soft Comput.
- TrustCom/BigDataSE/ISPA (2)
- J. Digit. Imaging
- Int. J. Parallel Emergent Distributed Syst.
- NBiS
- ICASSP
- Softw. Test. Verification Reliab.
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