EXPOSURE FUSION
Experts
- Alan Chalmers
- Kurt Debattista
- Mahsa T. Pourazad
- Frédéric Dufaux
- Panos Nasiopoulos
- Hitoshi Kiya
- Francesco Banterle
- Zhengguo Li
- Giuseppe Valenzise
- Rafal Mantiuk
- Shanmuganathan Raman
- Greg Ward
- Thomas Bashford-Rogers
- Masahiro Okuda
- Karol Myszkowski
- Jonas Unger
- Hans-Peter Seidel
- Rafal K. Mantiuk
- Patrick Ledda
- Wolfgang Heidrich
- Alessandro Artusi
- Yuma Kinoshita
- Steve Mann
- Takao Jinno
- Masahiro Iwahashi
- Cheolkon Jung
- Guoping Qiu
- Marcelo Bertalmío
- Alper Koz
- Ishtiaq Rasool Khan
- Ahmet Oguz Akyüz
- Gabriel Eilertsen
- Ronan Boitard
- Nikola Banic
- Gangyi Jiang
- Meng He
- Helge Seetzen
- Jinhua Wang
- Sven Loncaric
Venues
- CoRR
- ICIP
- ISCAS
- IEEE J. Solid State Circuits
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Sensors
- ICASSP
- ACM Trans. Graph.
- Comput. Graph. Forum
- Vis. Comput.
- Signal Process. Image Commun.
- J. Vis. Commun. Image Represent.
- IEEE Trans. Image Process.
- ICCE
- EUSIPCO
- ICECS
- IEEE Trans. Circuits Syst. II Express Briefs
- CVPR
- Color Imaging Conference
- IEEE Trans. Circuits Syst. Video Technol.
- ISSCC
- ICCV
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- J. Electronic Imaging
- IEEE Trans. Multim.
- CIC
- VCIP
- Multim. Tools Appl.
- BMVC
- Human Vision and Electronic Imaging
- APSIPA
- MWSCAS
- IEEE Trans. Consumer Electron.
- SCCG
- ICPR
- Signal Process.
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ESSCIRC
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