DEPTH FROM DEFOCUS
Experts
- Subhasis Chaudhuri
- Jean-Pierre Wigneron
- Paolo Favaro
- Shree K. Nayar
- Ke Xian
- Zhiguo Cao
- Michael S. Langer
- Lei Fan
- Chong-Min Kyung
- Christophe Moisy
- Xingming Wu
- Takayuki Hamamoto
- Tae-Sun Choi
- Shuwei Shao
- Frédéric Frappart
- Jingyi Yu
- A. N. Rajagopalan
- Stephen Lin
- Adriano Camps
- Murali Subbarao
- Ramesh Raskar
- Xiaojun Li
- Qionghai Dai
- Mengjia Wang
- Hiroshi Ikeoka
- Hajime Nagahara
- Xiangzhuo Liu
- Matthew A. Turk
- Rogério Schmidt Feris
- Jiang Yu Zheng
- Satoshi Ono
- Vaishakh Patil
- Zheng Zhu
- Philippe Ciais
- Hongliang Ma
- Xianda Guo
- Sergiu Nedevschi
- Dong Wang
- Tirza Routtenberg
Venues
- CoRR
- CVPR
- ICIP
- Remote. Sens.
- IGARSS
- IEEE Trans. Image Process.
- ICCV
- Int. J. Comput. Vis.
- ICASSP
- IEEE Trans. Geosci. Remote. Sens.
- Sensors
- IEEE Trans. Signal Process.
- IROS
- ICRA
- Pattern Recognit. Lett.
- 3DV
- IEEE Trans. Circuits Syst. Video Technol.
- IEEE Access
- EUSIPCO
- Pattern Recognit.
- ICTON
- BMVC
- ICCP
- IEEE Robotics Autom. Lett.
- Computational Imaging
- IECON
- EMBC
- IEEE Geosci. Remote. Sens. Lett.
- ACM Multimedia
- CVPR Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACCV (4)
- IEEE Trans. Commun.
- Digital Photography
- IEEE Trans. Medical Imaging
- IEEE Trans. Aerosp. Electron. Syst.
- ICCE
- Image Vis. Comput.
- Multim. Tools Appl.
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