CROSS BIN
Experts
- Sung-Hyuk Cha
- Honghong Zhao
- Francesc Serratosa
- Takayasu Fushimi
- Thomas Seidl
- Takuya Yoshino
- Kouichi Hirata
- Sargur N. Srihari
- Kazumi Saito
- Yaohong Jin
- Zhensheng Yang
- Jianquan Li
- Xiaokang Liu
- Min Yang
- Ruifeng Xu
- Hiroshi Motoda
- Hengwei Yu
- Kohei Muraka
- Odysseas Kechagias-Stamatis
- Marc Wichterich
- Yan Yan
- Alice Porebski
- Dariusz Frejlichowski
- Yuanyuan Wang
- Ofir Pele
- Feng Li
- Eugen Mühldorf
- Jiqing Xu
- Jier Wang
- Anca Maria Ivanescu
- Xiaodong Gu
- Yu Ma
- Norimichi Tsumura
- Zhihong Lin
- Denis Hamad
- Ou Wu
- Shoji Ezaki
- Sungsoo Yoon
- Shenglong Zhuo
Venues
- ICPR
- ICIP
- SSPR/SPR
- IEEE Trans. Ind. Electron.
- ICRA
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- FSKD
- Pattern Recognit. Lett.
- ISCAS
- J. Inf. Telecommun.
- ECCV (2)
- IC-AI
- Comput. Vis. Image Underst.
- BTW
- KDIR
- J. Imaging
- Intell. Data Anal.
- EMNLP (1)
- Elektron. Rechenanlagen
- VISAPP (1)
- IEEE METRICS
- Artif. Life Robotics
- IP&C
- Int. J. Pattern Recognit. Artif. Intell.
- DS
- IEEE Trans. Instrum. Meas.
- CoRR
- IET Image Process.
- ACM Multimedia
- DCAI (1)
- Computing
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