CROSS BIN
Experts
- Sung-Hyuk Cha
- Min Yang
- Kouichi Hirata
- Sargur N. Srihari
- Honghong Zhao
- Takuya Yoshino
- Ruifeng Xu
- Jianquan Li
- Xiaokang Liu
- Yaohong Jin
- Zhensheng Yang
- Kazumi Saito
- Francesc Serratosa
- Thomas Seidl
- Takayasu Fushimi
- Hiroaki Shimizu
- Hengwei Yu
- Kohei Muraka
- Séverine Dubuisson
- Alice Porebski
- Charles C. Tappert
- Toshiya Nakaguchi
- Ying Chen
- Nicolas Vandenbroucke
- Marc Wichterich
- Seung-Seok Choi
- Jiqing Xu
- Jier Wang
- Michael Werman
- Merih Seran Uysal
- Li Guo
- Sungsoo Yoon
- Taiga Kawaguchi
- Dariusz Frejlichowski
- Shoji Yamamoto
- Norimichi Tsumura
- Yuanyuan Wang
- Camille Kurtz
- Rajat Subhra Chakraborty
Venues
- SSPR/SPR
- ICIP
- ICPR
- BTW
- DS
- ECCV (2)
- IP&C
- ACM Multimedia
- IEEE METRICS
- CoRR
- EMNLP (1)
- IEEE Trans. Pattern Anal. Mach. Intell.
- FSKD
- Intell. Data Anal.
- IET Image Process.
- Pattern Recognit. Lett.
- J. Inf. Telecommun.
- ISCAS
- IEEE Trans. Instrum. Meas.
- DCAI (1)
- KDIR
- Computing
- Elektron. Rechenanlagen
- IEEE Trans. Ind. Electron.
- ICRA
- VISAPP (1)
- Artif. Life Robotics
- IC-AI
- J. Imaging
- Pattern Recognit.
- Int. J. Pattern Recognit. Artif. Intell.
- Comput. Vis. Image Underst.
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