CROSS BIN
Experts
- Sung-Hyuk Cha
- Thomas Seidl
- Honghong Zhao
- Xiaokang Liu
- Ruifeng Xu
- Kouichi Hirata
- Takuya Yoshino
- Sargur N. Srihari
- Min Yang
- Takayasu Fushimi
- Yaohong Jin
- Francesc Serratosa
- Kazumi Saito
- Jianquan Li
- Zhensheng Yang
- Pierre Gançarski
- Nicolas Vandenbroucke
- Ou Wu
- Rafael Molina
- Gerard Sanroma
- Dariusz Frejlichowski
- Yuanyuan Wang
- Nicolas Passat
- Marc Wichterich
- Hui-Dong Liu
- Alice Porebski
- Mar Pujol
- Seiya Okubo
- Jiqing Xu
- Seung-Seok Choi
- Patrick Yin Chiang
- Ana-Lorena Uribe-Hurtado
- Yan Yan
- Li Guo
- Christian Beecks
- Ramón Rizo
- Wei Yan
- Odysseas Kechagias-Stamatis
- Pilar Arques
Venues
- ICIP
- SSPR/SPR
- ICPR
- J. Inf. Telecommun.
- Intell. Data Anal.
- Pattern Recognit. Lett.
- KDIR
- IEEE Trans. Ind. Electron.
- CoRR
- DCAI (1)
- Elektron. Rechenanlagen
- ECCV (2)
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Imaging
- IP&C
- IEEE Trans. Instrum. Meas.
- DS
- Comput. Vis. Image Underst.
- BTW
- IEEE METRICS
- Artif. Life Robotics
- EMNLP (1)
- ACM Multimedia
- IC-AI
- Int. J. Pattern Recognit. Artif. Intell.
- VISAPP (1)
- FSKD
- IET Image Process.
- ISCAS
- Computing
- ICRA
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