CONTOUR POINTS
Experts
- Alexander Kolesnikov
- Kumar S. Ray
- António M. G. Pinheiro
- Bimal Kr. Ray
- Yung-Nien Sun
- Shu-Chien Huang
- Filiberto Pla
- Asif Masood
- Chandrajit L. Bajaj
- Minoru Asada
- Konrad Schindler
- Azriel Rosenfeld
- Rafael Medina Carnicer
- Kit Mills Bransby
- Ge Cong
- Siddhartha Chaudhuri
- Takashi Saito
- Yanis Ouakrim
- Takeshi Tokuyama
- David W. Jacobs
- Bianca Falcidieno
- Anuj Srivastava
- Marc Pollefeys
- Diane L. Souvaine
- Deva Ramanan
- Martin R. Oswald
- Audrey Richard
- Minhyuk Sung
- Andrea Alfieri
- Kuo-Liang Chung
- Josef Cibulka
- Mengtian Li
- Christos Bourantas
- Takao Nishizeki
- Bin Wang
- Takayuki Nakamura
- Ersin Yumer
- Yancong Lin
- Francisco José Madrid-Cuevas
Venues
- Pattern Recognit. Lett.
- Pattern Recognit.
- CoRR
- CVPR
- INTERSPEECH
- J. Vis. Commun. Image Represent.
- ICPR
- IJCAI
- ICIP
- Image Vis. Comput.
- IEICE Trans. Inf. Syst.
- IEEE Trans. Image Process.
- SHAPES
- ICPR (1)
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- ICIP (1)
- ICASSP
- ICCV
- Int. J. Pattern Recognit. Artif. Intell.
- ICIAR
- CAIP
- SCG
- Comput. Aided Des.
- SIAM J. Discret. Math.
- Sensors
- ICRA
- Comput. Geom.
- J. Imaging
- J. Electronic Imaging
- ACM Trans. Graph.
- Comput. Vis. Image Underst.
- ECCV
- J. Vis.
- ECCV (3)
- IEEE Trans. Vis. Comput. Graph.
- MICCAI (3)
- CBMS
- BMVC
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