AUTOMATIC SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Max A. Viergever
- Tomoya Sakai
- Atsushi Imiya
- Arjan Kuijper
- Frans Kanters
- J. Andrew Bangham
- Alfons H. Salden
- Marco Loog
- Nir A. Sochen
- Jinhai Li
- Jan J. Koenderink
- Lance R. Williams
- Michael Brady
- Christopher L. Wyatt
- Songde Ma
- Yaorong Ge
- Bryan W. Scotney
- Ali Shokoufandeh
- Jean-Michel Morel
- Mads Nielsen
- Sonya A. Coleman
- Kim Steenstrup Pedersen
- Yuchen He
- Bao Qing Hu
- Richard W. Harvey
- Madonna G. Herron
- Sung Ha Kang
- Changming Sun
- Shekoufeh Gorgi Zadeh
- Alison Bosson
- Makoto Sato
- Bram Platel
- Antoine Basset
- Jon Sporring
- Lewis D. Griffin
- Maximilian W. M. Wintergerst
Venues
- CoRR
- Scale-Space
- ICIP
- J. Math. Imaging Vis.
- SSVM
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- Pattern Recognit.
- ICPR
- Image Vis. Comput.
- Pattern Recognit. Lett.
- ICASSP
- Int. J. Comput. Vis.
- ICCV
- IEEE Trans. Image Process.
- ECCV (1)
- Int. J. Approx. Reason.
- DAGM-Symposium
- Remote. Sens.
- Comput. Graph. Forum
- Mach. Vis. Appl.
- IEEE Trans. Vis. Comput. Graph.
- IROS
- CAIP
- ACCV (2)
- INTERSPEECH
- ISBI
- Knowl. Based Syst.
- AAAI
- BMVC
- Inf. Sci.
- Sensors
- Medical Imaging: Image Processing
- EUSIPCO
- DICTA
- ECCV (2)
- Neurocomputing
- NeurIPS
- J. WSCG
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