AUTOMATIC SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Max A. Viergever
- Tomoya Sakai
- Atsushi Imiya
- Marco Loog
- Jan J. Koenderink
- Frans Kanters
- Jinhai Li
- Arjan Kuijper
- J. Andrew Bangham
- Nir A. Sochen
- Alfons H. Salden
- Sonya A. Coleman
- Jean-Michel Morel
- Sung Ha Kang
- Yaorong Ge
- Bryan W. Scotney
- Lance R. Williams
- Mads Nielsen
- Songde Ma
- Ali Shokoufandeh
- Kim Steenstrup Pedersen
- Richard W. Harvey
- Madonna G. Herron
- Michael Brady
- Bao Qing Hu
- Yuchen He
- Christopher L. Wyatt
- Hong Zhang
- Yang Zhao
- James H. Elder
- James C. Tilton
- Maria Wilches-Mogollón
- Kazufumi Kaneda
- Alfredo Petrosino
- Alex C. Kot
- Allen Y. Yang
Venues
- CoRR
- Scale-Space
- ICIP
- J. Math. Imaging Vis.
- SSVM
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- Pattern Recognit.
- ICPR
- Pattern Recognit. Lett.
- ICASSP
- Image Vis. Comput.
- Int. J. Comput. Vis.
- ICCV
- IEEE Trans. Image Process.
- Int. J. Approx. Reason.
- ECCV (1)
- IROS
- Mach. Vis. Appl.
- CAIP
- Comput. Graph. Forum
- DAGM-Symposium
- IEEE Trans. Vis. Comput. Graph.
- Remote. Sens.
- Medical Imaging: Image Processing
- Knowl. Based Syst.
- Neurocomputing
- DICTA
- EUSIPCO
- ECCV (2)
- Sensors
- ACCV (2)
- ISBI
- BMVC
- INTERSPEECH
- Inf. Sci.
- AAAI
- MIUA
- Bioinform.
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