AUTOMATIC SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Max A. Viergever
- Atsushi Imiya
- Tomoya Sakai
- Nir A. Sochen
- J. Andrew Bangham
- Jinhai Li
- Marco Loog
- Jan J. Koenderink
- Frans Kanters
- Alfons H. Salden
- Arjan Kuijper
- Yuchen He
- Kim Steenstrup Pedersen
- Christopher L. Wyatt
- Madonna G. Herron
- Songde Ma
- Jean-Michel Morel
- Bryan W. Scotney
- Ali Shokoufandeh
- Mads Nielsen
- Bao Qing Hu
- Sung Ha Kang
- Sonya A. Coleman
- Yaorong Ge
- Richard W. Harvey
- Lance R. Williams
- Michael Brady
- Haruhiko Nishiguchi
- Keiichi Uchimura
- Benoit Mory
- Xiuping Liu
- Remco Duits
- Jun Zhou
- Joëlle Thollot
- Yeeun Kim
- Stefan Heldmann
Venues
- CoRR
- Scale-Space
- ICIP
- J. Math. Imaging Vis.
- SSVM
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- Pattern Recognit.
- ICPR
- ICASSP
- Pattern Recognit. Lett.
- Image Vis. Comput.
- Int. J. Comput. Vis.
- ICCV
- IEEE Trans. Image Process.
- Int. J. Approx. Reason.
- ECCV (1)
- Mach. Vis. Appl.
- Remote. Sens.
- DAGM-Symposium
- CAIP
- Comput. Graph. Forum
- IROS
- IEEE Trans. Vis. Comput. Graph.
- ECCV (2)
- Medical Imaging: Image Processing
- AAAI
- ISBI
- DICTA
- ACCV (2)
- EUSIPCO
- Knowl. Based Syst.
- BMVC
- Inf. Sci.
- Neurocomputing
- ECCV (4)
- SCIA
- MIUA
- DGCI
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Related Keywords
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