ARC LENGTH
Experts
- Farzin Mokhtarian
- Ron Goldman
- Sadegh Abbasi
- Bert Jüttler
- Faouzi Ghorbel
- Josef Kittler
- Ron Kimmel
- Michael M. Bronstein
- John A. Roulier
- Thomas Lewiner
- Zbynek Sír
- Horace Ho-Shing Ip
- Stefanos D. Kollias
- Alexandru C. Telea
- Riku Suomela
- Allen R. Tannenbaum
- Yannis Avrithis
- Gabriel Altmann
- Herbert Edelsbrunner
- H. E. Bez
- Santiago Betelú
- Dan Raviv
- Anuj Srivastava
- Ioan-Iovitz Popescu
- Maher Ahmed
- Xiaohong Jia
- Jeff Erickson
- Mangayarkarasi Ramaiah
- Baojiang Zhong
- Guillermo Sapiro
- Alan K. Mackworth
- Emil Zagar
- Alexander M. Bronstein
- Juan Gerardo Alcázar
- John K. Tsotsos
- Hsien-Chih Chang
- Kalle Åström
- Rida T. Farouki
- Gregory Dudek
Venues
- CoRR
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Appl. Math. Comput.
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- CVPR
- ICCV
- Shape Modeling International
- Image Vis. Comput.
- Int. J. Comput. Vis.
- Discret. Comput. Geom.
- BMVC
- Int. J. Bifurc. Chaos
- J. Comput. Appl. Math.
- Am. Math. Mon.
- IEEE Computer Graphics and Applications
- Vis. Comput.
- Comput. Graph.
- ICPR (1)
- Comput. Vis. Image Underst.
- Computing
- ICIP
- DGCI
- IbPRIA
- ICASSP
- IEEE Trans. Inf. Theory
- SoCG
- IEEE Access
- ECCV (1)
- Glottometrics
- Finite Fields Their Appl.
- ACC
- J. Softw.
- IEEE Trans. Image Process.
- Autom.
- SIAM J. Sci. Comput.
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