ARC LENGTH
Experts
- Farzin Mokhtarian
- Sadegh Abbasi
- Bert Jüttler
- Ron Goldman
- Ron Kimmel
- Michael M. Bronstein
- Zbynek Sír
- Josef Kittler
- John A. Roulier
- Thomas Lewiner
- Horace Ho-Shing Ip
- Faouzi Ghorbel
- Stefanos D. Kollias
- Hsien-Chih Chang
- Alexandru C. Telea
- H. E. Bez
- Baojiang Zhong
- Alexander M. Bronstein
- Rida T. Farouki
- Anuj Srivastava
- Herbert Edelsbrunner
- Jeff Erickson
- Juan Gerardo Alcázar
- Gabriel Altmann
- Maher Ahmed
- Alan K. Mackworth
- Ioan-Iovitz Popescu
- Allen R. Tannenbaum
- Mangayarkarasi Ramaiah
- Mohamed Daoudi
- Santiago Betelú
- Gregory Dudek
- Xiaohong Jia
- Riku Suomela
- Marcos Craizer
- Guillermo Sapiro
- Dinggang Shen
- Dan Raviv
- Yannis Avrithis
Venues
- CoRR
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Appl. Math. Comput.
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- CVPR
- Int. J. Comput. Vis.
- Shape Modeling International
- ICCV
- Image Vis. Comput.
- Discret. Comput. Geom.
- BMVC
- Comput. Vis. Image Underst.
- Vis. Comput.
- Am. Math. Mon.
- ICPR (1)
- Comput. Math. Appl.
- ICIP
- Int. J. Bifurc. Chaos
- Comput. Graph.
- Computing
- IEEE Computer Graphics and Applications
- J. Comput. Appl. Math.
- ICPR
- IEEE Access
- Glottometrics
- Int. J. Comput. Vis. Robotics
- SIAM J. Math. Anal.
- ICASSP
- IbPRIA
- IEEE Trans. Image Process.
- ACC
- Comput. Appl. Eng. Educ.
- IEEE Trans. Inf. Theory
- Exp. Math.
- DGCI
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