Zaifu Zhang

Publication Activity (10 Years)

Years Active: 1993-1996
Publications (10 Years): 0

Publications

Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges
Statistical estimation of delay fault detectabilities and fault grading. J. Electron. Test. 8 (1) (1996)
Zaifu Zhang, Robert D. McLeod
An Efficient Multiple Scan Chain Testing Scheme. Great Lakes Symposium on VLSI (1996)
Richard W. Wieler, Zaifu Zhang, Robert D. McLeod
Emulating static faults using a Xilinx based emulator. FCCM (1995)
Zaifu Zhang, Robert D. McLeod, Gregory E. Bridges
Statistical estimation of delay fault detectabilities and fault grading. Great Lakes Symposium on VLSI (1995)
Zaifu Zhang, Robert D. McLeod, Witold Pedrycz
Augmenting Scan Path SRLs with an XOR Network to Enhance Delay Fault Testing. DFT (1994)
Richard W. Wieler, Zaifu Zhang, Robert D. McLeod
Simulating Static and Dynamic Faults in BIST Strucutres with a FPGA Based Emulator. FPL (1994)
Richard W. Wieler, Zaifu Zhang, Robert D. McLeod
Using an FPGA based computer as a hardware emulator for built-in self-test structures. RSP (1994)
Zaifu Zhang, Robert D. McLeod, Witold Pedrycz
A neural network algorithm for testing stuck-open faults in CMOS combinational circuits. J. Electron. Test. 4 (3) (1993)