A neural network algorithm for testing stuck-open faults in CMOS combinational circuits.
Zaifu ZhangRobert D. McLeodWitold PedryczPublished in: J. Electron. Test. (1993)
Keyphrases
- neural network
- cost function
- learning algorithm
- simulated annealing
- matching algorithm
- particle swarm optimization
- preprocessing
- high accuracy
- experimental evaluation
- analog vlsi
- dynamic programming
- k means
- optimal solution
- significant improvement
- worst case
- computational complexity
- detection algorithm
- hardware implementation
- similarity measure
- computational cost
- probabilistic model
- segmentation algorithm
- optimization algorithm
- objective function