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Yun-An Zhang
Publication Activity (10 Years)
Years Active: 2013-2024
Publications (10 Years): 8
Top Topics
State Space
Network Reliability
Information Exchange
Evaluation Method
Top Venues
Reliab. Eng. Syst. Saf.
IEEE Trans. Reliab.
Microelectron. Reliab.
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Publications
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Tao Liu
,
Guanghan Bai
,
Junyong Tao
,
Yun-An Zhang
,
Yining Fang
A Multistate Network Approach for Resilience Analysis of UAV Swarm considering Information Exchange Capacity.
Reliab. Eng. Syst. Saf.
241 (2024)
Bei Xu
,
Tao Liu
,
Guanghan Bai
,
Junyong Tao
,
Yun-An Zhang
,
Yining Fang
A multistate network approach for reliability evaluation of unmanned swarms by considering information exchange capacity.
Reliab. Eng. Syst. Saf.
219 (2022)
Tao Liu
,
Guanghan Bai
,
Junyong Tao
,
Yun-An Zhang
,
Yining Fang
,
Bei Xu
Modeling and evaluation method for resilience analysis of multi-state networks.
Reliab. Eng. Syst. Saf.
226 (2022)
Tao Liu
,
Guanghan Bai
,
Junyong Tao
,
Yun-An Zhang
,
Yining Fang
An improved bounding algorithm for approximating multistate network reliability based on state-space decomposition method.
Reliab. Eng. Syst. Saf.
210 (2021)
Guanghan Bai
,
Tao Liu
,
Yun-An Zhang
,
Junyong Tao
An Improved Method for Reliability Evaluation of Two-Terminal Multistate Networks Based on State Space Decomposition.
IEEE Trans. Reliab.
70 (3) (2021)
Guanghan Bai
,
Bei Xu
,
Xiaoguang Chen
,
Yun-An Zhang
,
Junyong Tao
Searching for d-MPs for All Level d in Multistate Two-Terminal Networks Without Duplicates.
IEEE Trans. Reliab.
70 (1) (2021)
Jia Wang
,
Xu Han
,
Yun-An Zhang
,
Guanghan Bai
Modeling the varying effects of shocks for a multi-stage degradation process.
Reliab. Eng. Syst. Saf.
215 (2021)
Guanghan Bai
,
Yanjun Li
,
Yining Fang
,
Yun-An Zhang
,
Junyong Tao
Network approach for resilience evaluation of a UAV swarm by considering communication limits.
Reliab. Eng. Syst. Saf.
193 (2020)
Yun-An Zhang
,
Jun-Yong Tao
,
Yan-Lei Wang
,
Zhi-Qian Ren
,
Bin Liu
,
Xun Chen
The effect of water on the mechanical properties of native oxide coated silicon structure in MEMS.
Microelectron. Reliab.
53 (9-11) (2013)