Yong Zhang

Publication Activity (10 Years)

Years Active: 2014-2017
Publications (10 Years): 6

Top Topics

Industrial Applications

Fault Detection

Nonlinear Systems

Top Venues

J. Frankl. Inst.

IEEE Trans. Control. Syst. Technol.

IEEE Trans. Fuzzy Syst.

IEEE Trans. Ind. Electron.

Publications

Zhengen Zhao, Ying Yang, Yong Zhang
Fault tolerant control using adaptive output integral-type sliding mode. J. Frankl. Inst. 354 (6) (2017)
Linlin Li, Steven X. Ding, Yong Zhang, Ying Yang
Optimal fault detection design via iterative estimation methods for industrial control systems. J. Frankl. Inst. 353 (2) (2016)
Linlin Li, Steven X. Ding, Jianbin Qiu, Ying Yang, Yong Zhang
Weighted Fuzzy Observer-Based Fault Detection Approach for Discrete-Time Nonlinear Systems via Piecewise-Fuzzy Lyapunov Functions. IEEE Trans. Fuzzy Syst. 24 (6) (2016)
Dan Liu, Ying Yang, Yong Zhang
Robust fault estimation for singularly perturbed systems with Lipschitz nonlinearity. J. Frankl. Inst. 353 (4) (2016)
Linlin Li, Steven X. Ding, Ying Yang, Yong Zhang
Robust fuzzy observer-based fault detection for nonlinear systems with disturbances. Neurocomputing 174 (2016)
Yong Zhang, Ying Yang, Steven X. Ding, Linlin Li
Optimal Design of Residual-Driven Dynamic Compensator Using Iterative Algorithms With Guaranteed Convergence. IEEE Trans. Syst. Man Cybern. Syst. 46 (4) (2016)
Ying Yang, Yong Zhang, Steven X. Ding, Linlin Li
Design and Implementation of Lifecycle Management for Industrial Control Applications. IEEE Trans. Control. Syst. Technol. 23 (4) (2015)
Linlin Li, Ying Yang, Steven X. Ding, Yong Zhang, Shouchao Zhai
On fault-tolerant control configurations for a class of nonlinear systems. J. Frankl. Inst. 352 (4) (2015)
Steven X. Ding, Ying Yang, Yong Zhang, Linlin Li
Data-driven realizations of kernel and image representations and their application to fault detection and control system design. Autom. 50 (10) (2014)
Yong Zhang, Ying Yang, Steven X. Ding, Linlin Li
Data-Driven Design and Optimization of Feedback Control Systems for Industrial Applications. IEEE Trans. Ind. Electron. 61 (11) (2014)