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Wei-Wei Chen
Publication Activity (10 Years)
Years Active: 2014-2024
Publications (10 Years): 9
Top Topics
High Coding Efficiency
Negative Feedback
Satellite Imagery
Coding Scheme
Top Venues
ASICON
J. Frankl. Inst.
ISCID
Sensors
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Publications
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Wei-Wei Chen
,
Hong-Li Li
Complete synchronization of delayed discrete-time fractional-order competitive neural networks.
Appl. Math. Comput.
479 (2024)
Hsien-Kuo Chang
,
Wei-Wei Chen
,
Jia-Si Jhang
,
Jin-Cheng Liou
Siamese Unet Network for Waterline Detection and Barrier Shape Change Analysis from Long-Term and Large Numbers of Satellite Imagery.
Sensors
23 (23) (2023)
Wei-Wei Chen
,
Bao-Yi Zhang
,
Zhen Weng
Charm Factors Extraction of Sustainable Packaging Attractiveness Based on Miryoku Engineering.
ISCID
(2022)
Hong-Xiang Li
,
Wen-Hui Li
,
Wei-Wei Chen
,
Peng-Jun Wang
Design of the admittance detecting circuit for silicon waveguides using the capacitor-integration method.
ASICON
(2019)
Ruo-Lan Yu
,
Wei Liang
,
Jie Zhang
,
Yan Li
,
Wei-Wei Chen
,
Peng-Jun Wang
An electro-optical full-subtractor using hybrid-integrated silicon-graphene waveguides.
ASICON
(2019)
Yung-Yi Wang
,
Chun-Wei Huang
,
Wei-Wei Chen
Maximum likelihood carrier frequency offset estimation algorithm with adjustable frequency acquisition region.
J. Frankl. Inst.
355 (5) (2018)
Yung-Yi Wang
,
Wei-Wei Chen
,
Shih-Jen Yang
An Interference Cancellation Technique for Distributed MIMO Systems.
Wirel. Pers. Commun.
98 (1) (2018)
Wei-Wei Chen
,
Shang-De Yang
,
Kuang-Wei Cheng
A 1.2 V 490 μW Sub-GHz UWB CMOS LNA with Current Reuse Negative Feedback.
ISCAS
(2018)
Shih-Jen Yang
,
Yung-Yi Wang
,
Wei-Wei Chen
A vector coding scheme with improved spectral efficiency for OFDM with frequency error.
J. Frankl. Inst.
353 (13) (2016)
Yung-Yi Wang
,
Wei-Wei Chen
A kernel-based ICI self-cancellation scheme using constrained subcarrier combiners.
Signal Process.
101 (2014)
Wei-Wei Chen
,
Xiaohua Ma
,
Bin Hou
,
Sheng-Lei Zhao
,
Jie-Jie Zhu
,
Jincheng Zhang
,
Yue Hao
Reliability investigation of AlGaN/GaN high electron mobility transistors under reverse-bias stress.
Microelectron. Reliab.
54 (6-7) (2014)