V. Reddy

Publication Activity (10 Years)

Years Active: 2007-2014
Publications (10 Years): 0

Top Topics

Normal Operation

Integrated Circuit

Top Venues

Microelectron. Reliab.

Publications

D. Varghese, V. Reddy, S. Krishnan, Muhammad Ashraful Alam
OFF-state degradation and correlated gate dielectric breakdown in high voltage drain extended transistors: A review. Microelectron. Reliab. 54 (8) (2014)
S. Chakravarthi, A. T. Krishnan, V. Reddy, S. Krishnan
Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation. Microelectron. Reliab. 47 (6) (2007)
Arun Hampapur, Sergio Borger, Lisa M. Brown, Christopher R. Carlson, Jonathan H. Connell, Max Lu, Andrew W. Senior, V. Reddy, Chiao-Fe Shu, Ying-li Tian
S3: The IBM Smart Surveillance System: From Transactional Systems to Observational Systems. ICASSP (4) (2007)