Toni T. Mattila

Publication Activity (10 Years)

Years Active: 2007-2014
Publications (10 Years): 0

Top Topics

Autonomous Agents

Reliability Assessment

Bp Neural Network Model

Top Venues

Microelectron. Reliab.

Publications

Jue Li, Mikael Broas, Jani Raami, Toni T. Mattila, Mervi Paulasto-Kröckel
Reliability assessment of a MEMS microphone under mixed flowing gas environment and shock impact loading. Microelectron. Reliab. 54 (6-7) (2014)
Toni T. Mattila, Laura Vajavaara, Jussi Hokka, Esa Hussa, Manu Mäkelä, Ville Halkola
Evaluation of the drop response of handheld electronic products. Microelectron. Reliab. 54 (3) (2014)
Toni T. Mattila, Heikki Ruotoistenmäki, Jani Raami, Jussi Hokka, Manu Mäkelä, Esa Hussa, Markku Sillanpää, Ville Halkola
An approach to adjust the board-level drop test conditions to improve the correlation with product-level drop impact. Microelectron. Reliab. 54 (4) (2014)
Toni T. Mattila, Jue Li, Jorma K. Kivilahti
On the effects of temperature on the drop reliability of electronic component boards. Microelectron. Reliab. 52 (1) (2012)
Juha Karppinen, Jue Li, J. Pakarinen, Toni T. Mattila, Mervi Paulasto-Kröckel
Shock impact reliability characterization of a handheld product in accelerated tests and use environment. Microelectron. Reliab. 52 (1) (2012)
Jussi Hokka, Jue Li, Toni T. Mattila, Mervi Paulasto-Kröckel
The reliability of component boards studied with different shock impact repetition frequencies. Microelectron. Reliab. 52 (7) (2012)
Toni T. Mattila, Mervi Paulasto-Kröckel
Toward comprehensive reliability assessment of electronics by a combined loading approach. Microelectron. Reliab. 51 (6) (2011)
Juha Karppinen, Jue Li, Toni T. Mattila, Mervi Paulasto-Kröckel
Thermomechanical reliability characterization of a handheld product in accelerated tests and use environment. Microelectron. Reliab. 50 (12) (2010)
Jussi Hokka, Toni T. Mattila, Jue Li, Jarmo Teeri, Jorma K. Kivilahti
A novel impact test system for more efficient reliability testing. Microelectron. Reliab. 50 (8) (2010)
J. Li, Toni T. Mattila, H. Xu, Mervi Paulasto
FEM simulations for reliability assessment of component boards drop tested at various temperatures. Simul. Model. Pract. Theory 18 (9) (2010)
Tomi Laurila, Toni T. Mattila, Vesa Vuorinen, Juha Karppinen, Jue Li, Mika Sippola, Jorma K. Kivilahti
Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests. Microelectron. Reliab. 47 (7) (2007)