Tangali S. Sudarshan

Publication Activity (10 Years)

Years Active: 2005-2009
Publications (10 Years): 0

Publications

Peter G. Muzykov, Robert M. Kennedy, Qingchun Zhang, Craig Capell, Al Burk, Anant Agarwal, Tangali S. Sudarshan
Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors. Microelectron. Reliab. 49 (1) (2009)
A. Grekov, Qingchun Zhang, Fatima Husna, Anant Agarwal, Tangali S. Sudarshan
Effect of crystallographic defects on the reverse performance of 4H-SiC JBS diodes. Microelectron. Reliab. 48 (10) (2008)
Toshiro Kubota, Parag Talekar, Xianyun Ma, Tangali S. Sudarshan
A nondestructive automated defect detection system for silicon carbide wafers. Mach. Vis. Appl. 16 (3) (2005)