Login / Signup
Stéphane Forster
Publication Activity (10 Years)
Years Active: 2001-2003
Publications (10 Years): 0
</>
Publications
</>
Stéphane Forster
,
Thierry Lequeu
,
Robert Jérisian
Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3.
Microelectron. Reliab.
43 (1) (2003)
Stéphane Moreau
,
Stéphane Forster
,
Thierry Lequeu
,
Robert Jérisian
Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal fatigue study in Q1 compared to Q2.
Microelectron. Reliab.
42 (9-11) (2002)
Stéphane Forster
,
Thierry Lequeu
,
Robert Jérisian
Operation of power semiconductors under transient thermal conditions: thermal fatigue reliability and mechanical aspects.
Microelectron. Reliab.
41 (9-10) (2001)