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Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3.

Stéphane ForsterThierry LequeuRobert Jérisian
Published in: Microelectron. Reliab. (2003)
Keyphrases
  • mobile devices
  • power consumption
  • computational model
  • electrical power
  • electronic devices
  • data sets
  • genetic algorithm
  • infrared
  • selection mechanism
  • battery life