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Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3.
Stéphane Forster
Thierry Lequeu
Robert Jérisian
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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mobile devices
power consumption
computational model
electrical power
electronic devices
data sets
genetic algorithm
infrared
selection mechanism
battery life