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Sae-Eun Kim
Publication Activity (10 Years)
Years Active: 2016-2018
Publications (10 Years): 3
Top Topics
Memory Usage
Fault Diagnosis
Segmented Images
Failure Rate
Top Venues
APCCAS
IEEE Trans. Circuits Syst. I Regul. Pap.
IEEE Trans. Computers
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Publications
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Sae-Eun Kim
,
Jaeyong Chung
,
Joon-Sung Yang
Mitigating Observability Loss of Toggle-Based X-Masking via Scan Chain Partitioning.
IEEE Trans. Computers
67 (8) (2018)
Chang-Hyun Oh
,
Sae-Eun Kim
,
Joon-Sung Yang
BIRA With Optimal Repair Rate Using Fault-Free Memory Region for Area Reduction.
IEEE Trans. Circuits Syst. I Regul. Pap.
(12) (2017)
Chang-Hyun Oh
,
Sae-Eun Kim
,
Joon-Sung Yang
A BIRA using fault-free memory region for area reduction.
APCCAS
(2016)