S. R. Stein

Publication Activity (10 Years)

Years Active: 2024-2024
Publications (10 Years): 1

Top Topics

Normal Operation

Top Venues

Publications

S. R. Stein, J. Kim, S. Das, Daniel J. Lichtenwalner, S. Ryu
Characterization of Interface Trap Density in SiC MOSFETs Subjected to High Voltage Gate Stress. IRPS (2024)