R. O. Nunes

Publication Activity (10 Years)

Years Active: 2017-2018
Publications (10 Years): 2

Top Topics

Gender Differences

Integrated Circuit

Success Or Failure

Top Venues

Microelectron. Reliab.

Publications

R. O. Nunes, R. L. de Orio
Operational Amplifier Performance Degradation and Time-to-Failure due to Electromigration. SBCCI (2018)
R. O. Nunes, R. L. de Orio
Study of the impact of electromigration on integrated circuit performance and reliability at design level. Microelectron. Reliab. (2017)